2025

1. Hwan Kim, Yangjin Kim*, Yusuke Ito, and Naohiko Sugita, “Precise three-surface interferometry for thickness separation in blank masks,” Measurement, Accepted, (2025).
2. Jurim Jeon, Yangjin Kim*, Yusuke Ito, Naohiko Sugita, and Kenichi Hibino, “Glass thickness testing using Fizeau interferometer with suppression of environmental factors,” Precision Engineering, Accepted, (2025).

2024

1. Juncheol Bae, Yangjin Kim*, Yusuke Ito, and Naohiko Sugita, “Development of Gaussian window function for precision topography of silicon-wafer surface using wavelength-modulation interferometry,” International Journal of Precision Engineering and Manufacturing, Accepted, (2024).
2. Yangjin Kim*, Sungtae Kim, Habeom Lee, Songkil Kim, Sang Hu Park, Yusuke Ito, and Naohiko Sugita, “Design of phase-reconstruction algorithm: insensitivity to intensity modulation,” Journal of Mechanical Science and Technology 38, 3569-3575 (2024).
3. Wonjun Bae, Yangjin Kim*, Seokyoung Ahn, Yusuke Ito, and Naohiko Sugita, “Scanning interferometric phase-calculation formula for simultaneous topographic profiling of thickness and surface of optical flats,” Optics and Laser Technology 169, 110082 (2024).
4. Sungtae Kim, Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Assessment and verification of thickness homogeneity in mask blank by utilizing main harmonics of triple-surface interferometry,” Precision Engineering 85, 174-182 (2024).

2023

1. Hwan Kim, Jurim Jeon, Sungtae Kim, Yangjin Kim*, and Naohiko Sugita, “Simultaneous interferometric profilometry of surface and thickness of transparent plate using wavelength modulation,” Optik 295, 171523 (2023).
2. Jurim Jeon, Yangjin Kim*, and Naohiko Sugita, “Influence of windows on the phase error of interferometric surface topography of a wafer using wavelength scanning,” Journal of Mechanical Science and Technology 37, 4809-4816 (2023).
3. Sungtae Kim, Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Surface topography of transparent plate using Fizeau interferometer with suppression of intensity modulation,” International Journal of Precision Engineering and Manufacturing – Smart Technology 1, 157-163 (2023).
4. Sungtae Kim, Jurim Jeon, Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Design and assessment of phase-shifting algorithms in optical interferometer,” International Journal of Precision Engineering and Manufacturing – Green Technology 10, 611-634 (2023).
5. Sungtae Kim, Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Surface assessment of transparent glass plate with wavelength-modulated interferometry and harmonic phase-iterative method,” International Journal of Precision Engineering and Manufacturing – Smart Technology 1, 71-81 (2023).

2022

1. Sungtae Kim, Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous thickness and surface profiling of blank mask and its experimental verification using robust harmonic fringe-iterative algorithm and Fizeau interferometer,” Optics Communications 520, 128460 (2022).
2. Sungtae Kim, Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Interferometric thickness assessment of optical flat by combining iterative analysis and wavelength tuning,” Optik 265, 169450 (2022).
3. Jurim Jeon, Yangjin Kim*, Sungtae Kim, Kenichi Hibino, and Naohiko Sugita, “Fringe analysis for thickness estimation of optical glass plate using Fizeau interferometer,” Optics Communications 513, 128086 (2022).
4. Jihyang Byon, Sangjune Park, Yangjin Kim, and Seokyoung Ahn*, “External exposure specific analysis for radiation worker in reuse of containment building for Kori Unit 1,” Nuclear Engineering and Technology 54, 1781-1788 (2022).
5. Wonjun Bae, Junghwan Kim, Seungchan Cho, Yangjin Kim*, and Sang-Kwan Lee*, “Suppression of thermal deformation of machine tool spindle using TiC-Fe composite,” Journal of Mechanical Science and Technology 36, 2511-2520 (2022).
6. Sungtae Kim, Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Surface measurement of silicon wafer using harmonic phase-iterative analysis and wavelength-scanning Fizeau interferometer,” Precision Engineering 75, 142-152 (2022).

2021

1. Sungtae Kim, Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Wavelength-tuning interferometry with suppression of dispersive error,” Optik 247, 167993 (2021).
2. Jiwon Seo, Yangjin Kim*, Wonjun Bae, Young Hoon Moon, and Naohiko Sugita, “Wavelength-tuning multiple-surface interferometric analysis with compression of Zernike piston phase error,” Measurement 185, 110078 (2021).
3. Wonjun Bae, Sungtae Kim, Yangjin Kim*, and Sang-Kwan Lee*, “Suppression of machine tool spindle vibration using TiC-SKH51 metal-matrix composite,” Journal of Mechanical Science and Technology 35, 3619-3625 (2021).
4. Jurim Jeon, Sungtae Kim, and Yangjin Kim*, “Precise interferometric surface profiling of silicon wafer using sampling window and wavelength tuning,” Journal of Mechanical Science and Technology 35, 2177-2184 (2021).
5. Wonjun Bae and Yangjin Kim*, “Phase extraction formula for glass thickness measurement using Fizeau interferometer,” Journal of Mechanical Science and Technology 35, 1623-1632 (2021).
6. Yangjin Kim*, Jiwon Seo, Wonjun Bae, Young Hoon Moon, Yusuke Ito, and Naohiko Sugita, “Wavelength-modulation Fourier interferometry with elimination of DC phase error,” Precision Engineering 68, 97-105 (2021).
7. Young Yun Woo, Dae-Cheol Ko, Taekyung Lee, Yangjin Kim, Ji Hoon Kim, and Young Hoon Moon*, “Application of support vector regression and genetic algorithm to reduce web warping in flexible roll-forming process,” Journal of Manufacturing Science and Engineering – Transactions of the ASME 143, 031010 (2021).
8. Sungtae Kim, Yangjin Kim*, Sung-Chul Shin, Kenichi Hibino, and Naohiko Sugita, “Interferometric thickness measurement of glass plate by phase modulation analysis using wavelength scanning with elimination of bias phase error,” Optical Review 28, 48-57, (2021).
9. Wonjun Bae, Yangjin Kim*, Young Hoon Moon, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous thickness variation and surface profiling of glass plates using Fizeau interferometer with elimination of offset phase error,” Optics Communications 480, 126500 (2021).
10. Yangjin Kim*, Wonjun Bae, Young Hoon Moon, Kenichi Hibino, and Mamoru Mitsuishi, “Fourier interferometry of multi-layer sample using wavelength tuning and partially negative window,” Optics and Lasers in Engineering 137, 106350 (2021).

2020

1. Nam Yong Kim, Dae-Cheol Ko, Yangjin Kim, Sang Wook Han, Il Yeong Oh, and Young Hoon Moon*, “Feasibility of reduced ingot hot-top height for the cost-effective forging of heavy steel ingots,” Materials 13, 2916 (2020).
2. Yangjin Kim*, Young Hoon Moon, Kenichi Hibino, and Mamoru Mitsuishi, “Thickness profiling of transparent plate using wavelength-tuned phase-shifting analysis,” Measurement 161, 10870 (2020).
3. Fuqing Miao*, Seokyoung Ahn, and Yangjin Kim*, “Precise measurement of the surface shape of silicon wafer by using a new phase shifting algorithm and wavelength tuning interferometer,” Applied Sciences 10, 3250 (2020).
4. Zu Seong Park, Young Yun Woo, Sang Wook Han, Il Yeong Oh, Tae Woo Hwang, Yangjin Kim, and Young Hoon Moon*, “System development for diffusion bonding of multiple unit tubes to produce long tubular tungsten heavy alloys,” Applied Sciences 10, 2988 (2020).
5. Yaghoub Dadgar Asl, Young Yun Woo, Yangjin Kim, Young Moon Moon*, “Non-sorting multi-objective optimization of flexible roll forming using artificial neural networks,” The International Journal of Advanced Manufacturing Technology 107, 2875–2888 (2020).
6. Yangjin Kim*, Younghoon Moon, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous measurement of the surface shape and thickness for an optical flat with a wavelength-tuning Fizeau interferometer with suppression of drift error,” Applied Optics 59, 991–997 (2020).
7. Chun Su Park, She Wook Bae, Jin Rae Cho, Habeom Lee, Yangjin Kim, and Young Hoon Moon*, “Corrugated cooling unit for accelerated cooling of rebar subjected to Tempcore process,” Applied Thermal Engineering 167, 114699 (2020).
8. Zu Seong Park, Chester J. VanTyne, Jeong Kim, Tae Woo Hwang, Yangjin Kim, and Young Hoon Moon*, “Die-less manufacturing of tube by diffusion bonding of unit rods made of tungsten heavy alloy,” The International Journal of Advanced Manufacturing Technology 106, 1213–1221 (2020).

2019

1. Fuqing Miao, Seokyoung Ahn, Younghoon Moon, and Yangjin Kim*, “Surface profilometry of silicon wafers using wavelength-tuned phase-shifting interferometry,” Journal of Mechanical Science and Technology 33, 5327–5335 (2019).
2. Daniyal Abolhasani, S. M. Hossein Seyedkashi, Namhyun Kang, Yang Jin Kim, Young Yun Woo, and Young Hoon Moon*, “Analysis of melt-pool behaviors during selective laser melting of AISI 304 stainless-steel composites,” Metals 9, 876–890 (2019).
3. Yangjin Kim*, “Interferometric profilometry of absolute optical thickness of transparent plate using wavelength tuning fringe analysis,” Journal of Mechanical Science and Technology 33, 2841–2846 (2019).

2018

1. Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Measurement of surface profile and thickness of multilayer wafer using wavelength-tuning fringe analysis,” Precision Engineering 52, 130–137 (2018).
2. Yangjin Kim*, Kenichi Hibino, and Mamoru Mitsuishi, “Interferometric profile measurement of optical-thickness by wavelength tuning with suppression of spatially uniform error,” Optics Express 26, 10870–10878 (2018).

2017

1. Yangjin Kim* and Kenichi Hibino, “Statistical and interferometric determination of optical thickness of multilayer transparent plate,” Optical Review 24, 734–740 (2017).
2. Yangjin Kim*, “Precision interferometric surface metrology of transparent thin film using wavelength tuning,” Journal of Mechanical Science and Technology 31, 5423–5428, (2017).
3. Yangjin Kim*, Kenichi Hibino, Toru Kizaki, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous interferometric measurement of the absolute thickness and surface shape of a transparent plate using wavelength tuning Fourier analysis and phase shifting,” Precision Engineering 48, 347–351 (2017).
4. Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Phase-shifting algorithm to suppress inner reflection in wavelength tuning Fizeau interferometer,” Precision Engineering 48, 67–74 (2017).

2016

1. Kenichi Hibino*, Ryohei Hanayama, and Yangjin Kim, “Absolute interferometric test for high numerical-aperture spherical concave surfaces: gravitational effect,” Measurement 94, 920–926 (2016).
2. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Error-compensating phase-shifting algorithm for surface shape measurement of transparent plate using wavelength-tuning Fizeau interferometer,” Optics and Lasers in Engineering 86, 309–316 (2016).
3. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Interferometric measurement of surface shape by wavelength tuning suppressing random intensity error,” Applied Optics 55, 6464–6470 (2016).
4. Kenichi Hibino*, and Yangjin Kim, “Canceling the momentum in a phase-shifting algorithm to eliminate spatially uniform errors,” Applied Optics 55, 6331–6335 (2016).
5. Yangjin Kim*, Naohiko Sugita, and Mamoru Mitsuishi, “Measurement of highly reflective surface shape using wavelength tuning Fizeau interferometer and polynomial window function,” Precision Engineering 45, 187–194, (2016).
6. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Compensation for correlated error in multilayer interferometer,” Applied Optics 55, 171–177 (2016).

2015

1. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous measurement of surface shape and optical thickness using wavelength tuning and a polynomial window function,” Optics Express 23, 32869–32880 (2015).
2. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Measurement of optical thickness variation of BK7 plate by wavelength tuning interferometry,” Optics Express 23, 22928–22938 (2015).
3. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Surface measurement of indium tin oxide thin film by wavelength-tuning Fizeau interferometry,” Applied Optics 54, 7135–7141 (2015).
4. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Measurement of absolute optical thickness of mask glass by wavelength tuning Fourier analysis,” Optics Letters 40, 3169–3172 (2015).
5. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Surface profile measurement of a highly reflective silicon wafer by phase-shifting interferometry,” Applied Optics 54, 4207–4213 (2015).
6. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Absolute optical thickness measurement of transparent plate using excess fraction method and wavelength-tuning Fizeau interferometer,” Optics Express 23, 4065–4073 (2015).

~ 2014

1. Yangjin Kim*, Kenichi Hibino, Ryohei Hanayama, Naohiko Sugita, and Mamoru Mitsuishi, “Multiple-surface interferometry of highly reflective wafer by wavelength tuning,” Optics Express 22, 21145–21156 (2014).
2. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Design of phase shifting algorithms: fringe contrast maximum,” Optics Express 22, 18203–18213 (2014).
3. Yangjin Kim*, Kenichi Hibino, Naohiko Sugita, and Mamoru Mitsuishi, “Optical thickness measurement of mask blank glass plate by the excess fraction method using a wavelength-tuning interferometer,” Optics and Lasers in Engineering 51, 1173–1178 (2013).
4. Kenichi Hibino*, Yangjin Kim, Sangyu Lee, Yohan Kondo, Naohiko Sugita, and Mamoru Mitsuishi, “Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometry,” Optical Review 19, 247–253 (2012).